Structural, dielectric, linear and nonlinear optical parameters of Zn0.9 Cu0.1 S filled PVA/CMC/PEG blends
El-naggar, A. M.; Heiba, zein Elabidin; Kamal, A. M.; Mohamed, Mohamed Bakr;
Abstract
Casting and solid-state reaction methods were used to prepare composites of PVA/CMC/PEG/x wt% Zn0.9Cu0.1S (x = 0, 1, 3, 5, 10). The nanofiller Zn0.9Cu0.1S was investigated applying XRD Rietveld analysis. XRD, FTIR, SEM, and EDS techniques were used to trace the variation of the structure and morphology of the PVA/CMC/PEG blend upon loading with different Zn0.9Cu0.1S contents. The effect of the filler content (x) on the linear and nonlinear features of the host blend was examined. The direct and indirect optical band gaps of PVA/CMC/PEG (5.87 and 5.31 eV) reduced upon loading with Zn0.9Cu0.1S, attaining minimum values (4.47 and 3.65 eV) for x = 10%. The fluorescence intensity and the emitted colors of the blends depended on the amount of the nanofiller. The dielectric constant (ε′), dielectric loss factor (ε′′), the real (M′) and imaginary (M′′) parts of the electric modulus changed nonmonotonically with the nanofiller content (x). Among all blends, ε′ disclosed higher values for the blend with x = 10 wt% and lowest ones for x = 1 wt%, while ε′′ attained highest values for the blend with x = 3 wt%, and lowest values for x = 5 wt%.
Other data
Title | Structural, dielectric, linear and nonlinear optical parameters of Zn<inf>0.9</inf>Cu<inf>0.1</inf>S filled PVA/CMC/PEG blends | Authors | El-naggar, A. M.; Heiba, zein Elabidin ; Kamal, A. M.; Mohamed, Mohamed Bakr | Keywords | Linear and nonlinear optical;Nano Zn Cu S doped amount;PVA/CMC/PEG;Structure;dielectric | Issue Date | 1-Sep-2023 | Journal | Optical and Quantum Electronics | Volume | 55 | ISSN | 03068919 | DOI | 10.1007/s11082-023-05085-0 | Scopus ID | 2-s2.0-85163778203 |
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